清华大学材料学院,北京国家电子显微镜中心与先进材料实验室,北京 100084
王博亚(1996—),男,博士,锂离子电池,E-mail:boyawang@mail.tsinghua.edu.cn ;
谷林,教授,电子显微学,E-mail:lingu@tsinghua.edu.cn 。
收稿:2026-09-23,
修回:2026-10-17,
网络首发:2026-10-21,
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王博亚, 谷林. 看见锂离子电池中的轻元素:原子分辨电子显微成像的技术进展与定量化挑战[J]. 储能科学与技术, XXXX, XX(XX): 1-14.
Wang Boya, Gu Lin. Visualizing Light Elements in Lithium Ion Batteries: Advances and Quantitative Challenges in Atomic-Resolution Electron Microscopy[J]. Energy Storage Science and Technology, XXXX, XX(XX): 1-14.
王博亚, 谷林. 看见锂离子电池中的轻元素:原子分辨电子显微成像的技术进展与定量化挑战[J]. 储能科学与技术, XXXX, XX(XX): 1-14. DOI: 10.19799/j.cnki.2095-4239.2026.0840.
Wang Boya, Gu Lin. Visualizing Light Elements in Lithium Ion Batteries: Advances and Quantitative Challenges in Atomic-Resolution Electron Microscopy[J]. Energy Storage Science and Technology, XXXX, XX(XX): 1-14. DOI: 10.19799/j.cnki.2095-4239.2026.0840.
Li、Na等载流离子的占位与迁移以及O、F等阴离子亚晶格的重排,直接影响离子电池材料的相变、离子输运和结构稳定性。然而,轻元素电子散射能力弱,且常与过渡金属共存,其原子尺度结构长期以来难以被直接解析。本文围绕高角环形暗场扫描透射电子显微镜(HAADF-STEM)、环形明场扫描透射电子显微镜(ABF-STEM)、积分差分相位衬度扫描透射电子显微镜(iDPC-STEM)和电子叠层成像,综述原子分辨轻元素成像的物理基础、技术进展及其在电池材料中的代表性应用。HAADF-STEM可稳定表征重元素骨架、阳离子缺陷和结-构重构;ABF-STEM进一步实现Li、O等轻元素原子柱的直接观察;iDPC-STEM通过提高低角散射电子的利用效率,可同步呈现轻、重元素,并揭示Li占位、局部锂化状态和非均匀脱嵌行为;电子叠层成像则利用四维衍射数据进行相位重构和像差校正,在较低剂量下实现Li和O的高对比度成像,并逐步拓展至非常规Li位点判定和三维空位解析。本文同时指出,轻元素“可见”并不等同于可靠定量,样品厚度、晶体倾斜、多重散射、投影重叠及电子束损伤均可能影响弱原子柱的强度和表观位置。未来需建立标准化的低剂量采集、图像模拟、误差评估和多技术交叉验证流程,并结合低温与原位实验、多层叠层重构及数据驱动分析,实现轻元素三维占位与动态迁移的定量表征,为揭示电池反应和失效机制提供可靠的结构依据。
The site occupancy and migration of charge carriers such as Li and Na
together with rearrangements of anionic sublattices involving O and F
directly govern phase transitions
ion transport
and structural stability in ion batteries. However
the weak electron-scattering ability of light elements and their coexistence with transition metals make their atomic-scale structures difficult to resolve directly. This review summarizes the physical basis
technical advances
and representative battery applications of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM)
annular bright-field scanning transmission electron microscopy (ABF-STEM)
integrated differential phase-contrast scanning transmission electron microscopy (iDPC-STEM)
and electron ptychography. HAADF-STEM provides robust characterization of heavy-element frameworks
cation defects
and structural reconstruction. ABF-STEM extends direct imaging to light-element columns such as Li and O. By improving the utilization of low-angle scattered electrons
iDPC-STEM enables simultaneous visualization of light and heavy elements and reveals Li-site occupancy
local lithiation states
and heterogeneous deintercalation. Electron ptychography reconstructs phase information from four-dimensional diffraction datasets and permits post-acquisition aberration correction
providing high-contrast Li and O imaging at relatively low electron doses. Its recent applications have further enabled identification of unconventional Li sites and three-dimensional analysis of vacancy distributions. Nevertheless
visualizing light elements does not necessarily ensure reliable quantification. Specimen thickness
crystal tilt
multiple scattering
projection overlap
and electron-beam damage can all modify the intensity and apparent positions of weakly scattering atomic columns. Future studies should therefore establish standardized workflows integrating low-dose acquisition
image simulation
uncertainty evaluation
and multimodal validation. Combined with cryogenic and in situ experiments
multislice ptychographic reconstruction
and data-driven analysis
these developments are expected to enable quantitative determination of the three-dimensional occupancy and dynamic migration of light elements
providing a more reliable structural basis for understanding battery reactions and degradation mechanisms.
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